SN74BCT8374ADWRE4

SN74BCT8374ADWRE4

Manufacturer

Texas Instruments

Product Category

2bfd5aa85b83e943477b3eceb175b9e8

Description

IC SCAN TEST DEVICE W/FF 24-SOIC

Specifications

  • 9d948e617b083222afc868add2f50ec2
    74BCT
  • 209802fb858e2c83205027dbbb5d9e6c
    Tape & Reel (TR)
  • 4777edf8670f9385d688b847e5bbaf8d
    Obsolete
  • 78b4922e836680f8c8528806159dec45
    Scan Test Device with D-Type Edge-Triggered Flip-Flops
  • 09577f6c61e96e09f93aec376009c6f4
    4.5V ~ 5.5V
  • d7e98c8d0c71e95b4dccaa926dd719a9
    8
  • 412e4c542af080ab01a4a70d9e9f9b47
    0°C ~ 70°C
  • 2d9adb2695c410f662de67c721d29d09
    Surface Mount
  • 7140d21740157aedbad23bcca1123862
    24-SOIC (0.295", 7.50mm Width)
  • 4d98c9db8ceedec5a4d3e55b9c7847b4
    24-SOIC

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